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Hier finden Sie wissenschaftliche Publikationen aus den FraunhoferInstituten. Statistical tests to determine spatial correlations in the response behavior of PUFs
 Institute of Electrical and Electronics Engineers IEEE: 12th Conference on Ph.D. Research in Microelectronics and Electronics, PRIME 2016 : 27th  30th of June 2016, Lisbon, Portugal Piscataway, NJ: IEEE, 2016 ISBN: 9781509004928 ISBN: 9781509004935 4 S. 
 Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) <12, 2016, Lisbon> 

 Englisch 
 Konferenzbeitrag 
 Fraunhofer IMS () 
 physically unclonable functions; spatial correlation; statistical randomness tests 
Abstract
The level of security provided by physically unclonable functions (PUFs) strongly depends on the unpredictability of its challengeresponse behavior. Systematic variation in the properties of a PUF might introduce correlations in the output bits. The mutual dependence of response bits is typically not detected by conventional methods, thus leaving the PUF vulnerable to prediction attacks. New methods accounting for the spatial distribution of response bits are presented, allowing to detect security leaks due to correlation effects at device level. The presented methods are easily applicable to a widerange of arraybased PUFs.